Product Category: Scanning electrochemical systems

Series: VersaSCAN

Manufacturer: AMETEK Scientific Instruments

Core Capability: Spatially resolved electrochemical and surface measurements

Platform Type: Modular, multi-technique scanning probe workstation

Primary Advantage: Localized analysis instead of averaged electrochemical response

Positioning System:

• Piezoelectric motor-driven stages on all axes

• Exceptional precision, repeatability, and resolution

• Large scan areas combined with unmatched spatial resolution

• Superior to step-motor and conventional AFM positioning systems

Installation & Training:

• Full white-glove installation service

• On-site system assembly, leveling, and verification

• Checkout on test samples

• User training on techniques and operation

Multi-Technique Capability:

• Common positioning system and software

• Supports multiple scanning electrochemical and surface analysis techniques

• High-resolution measurements over large areas

Typical Applications:

• Corrosion and coatings analysis

• Energy materials and batteries

• Catalysts and membranes

• Microstructural and surface heterogeneity studies

• Biomedical and biosensing research

VersaSCAN Measurement Techniques – Overview

VSC-SECM – Scanning Electrochemical Microscope (DC & AC)

The VSC-SECM is the most widely used VersaSCAN technique, enabling localized electrochemical imaging using an ultramicroelectrode probe and a 2-channel potentiostat.

Key Capabilities:

• Feedback Mode and Generator–Collector Mode

• Local current mapping with ultrahigh sensitivity

• AC-SECM for impedance-based imaging

• Optional Soft Stylus probe for constant-distance and biological samples

Applications:

• Corrosion and catalyst activity mapping

• Membrane and reaction kinetics studies

• Biosensing and surface reactivity analysis

VSC-STYLUS – Constant Distance SECM

Developed in collaboration with SENSàSION (EPFL), the Soft Stylus Probe enables constant-distance SECM without complex feedback electronics.

Key Benefits:

• Constant distance imaging on rough or tilted samples

• Extremely low contact force (ideal for biological materials)

• Faster measurements with minimal setup

• Low-cost constant-distance SECM solution

• Easy probe maintenance and replacement

VSC-LEIS – Localized Electrochemical Impedance Spectroscopy

The VSC-LEIS technique brings spatial resolution to EIS measurements, enabling localized impedance mapping.

Key Capabilities:

• Local impedance magnitude and phase mapping

• Single-point frequency sweeps or area mapping

• Bode and Nyquist representations

• Time-resolved imaging

Applications:

• Coating failure analysis

• Local State-of-Charge (SoC) mapping

• Corrosion and degradation studies

VSC-SVET – Scanning Vibrating Electrode Technique

SVET maps localized current density by measuring voltage gradients in solution using a vibrating microelectrode.

Key Capabilities:

• Detection of corrosion pits and galvanic couples

• Time-lapse imaging of corrosion evolution

• Lock-in amplifier detection for ultra-low signal levels

Applications:

• Non-uniform corrosion studies

• Welds, crevices, and galvanic corrosion

• Biological electrochemical systems

VSC-SKP – Scanning Kelvin Probe Microscope

The VSC-SKP measures relative work function to map anodic and cathodic regions of a surface, typically under ambient conditions.

Key Capabilities:

• Non-destructive work function measurement

• Correlation with corrosion potential (Ecorr)

• Topography Mode and Constant-Distance operation

Applications:

• Corrosion potential mapping

• Coated and painted surfaces

• Welds and heterogeneous materials

VSC-OSP – Optical Surface Profiler

The VSC-OSP is a non-contact, laser-based optical profiler used to map surface topography.

Key Capabilities:

• High-accuracy diffuse reflection laser profiling

• Topography mapping for constant-distance measurements

• Integration with other VersaSCAN techniques

Applications:

• Surface leveling and profiling

• Correlation of electrochemical data with topography