LINSEIS Thermoelectric Measurement Systems – LSR Thermoelectrics
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LINSEIS Thermoelectric Measurement Systems – LSR Thermoelectrics
Thermoelectric Measurement Systems – LSR Thermoelectrics by Linseis are advanced analytical platforms designed for the complete characterization of thermoelectric materials and devices.
The LSR Thermoelectrics family enables precise and reproducible measurement of all key thermoelectric parameters, including:
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Seebeck coefficient
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Electrical conductivity / resistance
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Thermal conductivity
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Figure of merit (ZT) using the Harman method
These systems support research and industrial development of thermoelectric materials used in waste heat recovery, thermoelectric generators (TEG), Peltier elements, sensors, thermoelectric modules, and pads, across a very wide temperature range.
LSR Measuring Principle
Samples (prismatic or cylindrical) are positioned vertically between two electrodes inside a controlled furnace environment. A precisely generated temperature gradient induces a thermoelectric voltage, measured with high-accuracy thermocouples. Electrical resistance is determined using the DC quadripole method, while thermal conductivity and ZT are calculated via the Harman method. Fully automated software sequences ensure maximum repeatability and user-independent results.
Linseis LSR & Thermoelectric Systems Portfolio
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LSR-1 – Seebeck coefficient & specific electrical resistance (materials and thin films)
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LSR-3 – Complete thermoelectric characterization: Seebeck, electrical conductivity, Harman method, ZT (materials & modules)
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TEG-Tester – Dedicated system for thermoelectric generators and Peltier elements (module-level performance)
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TF-LFA – Thin film thermal conductivity & diffusivity (10 nm – 20 µm)
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TFA (Thin Film Analyzer) – Thermal & electrical properties of thin films (3ω, Van der Pauw, Seebeck)
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HCS 1 / 10 / 100 – Hall Effect systems for carrier concentration, mobility, resistivity and semiconductor characterization
Interchangeable ovens allow operation from cryogenic temperatures (–160 °C) up to 1500 °C, with inert, oxidizing, reducing atmospheres or vacuum. Infrared furnaces provide very high heating and cooling rates with exceptional temperature stability.
• Complete thermoelectric characterization: Seebeck, electrical & thermal conductivity, ZT
• Supports bulk materials, modules, thin films, wires and foils
• Harman method for direct ZT determination
• Automated measurement sequences with state-of-the-art software
• Interchangeable ovens covering –100 °C to 1500 °C
• Infrared furnaces for fast heating/cooling and precise control
• Dedicated systems for materials (LSR-1, LSR-3) and modules (TEG-Tester)
• Thin film analysis down to 10 nm (TF-LFA, TFA)
• Hall Effect systems (HCS series) for semiconductor properties
• High reproducibility due to optimized sample holders
• Suitable for waste heat recovery, TEGs, Peltier elements, sensors and modules
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Professional guidance for product selection
After-sales service and maintenance
Always available technical assistance