HIDEN Analytical | Surface Analysis Products

Compact SIMS

Compact secondary ion mass spectrometry (SIMS) system with high isotopic sensitivity and a user-friendly design for advanced surface analysis.

AutoSIMS

Automated high-throughput SIMS system capable of performing hundreds of surface analysis processes per day without operator intervention.

SIMS / SNMS Workstation

Versatile surface analysis workstation combining dynamic and static SIMS with SNMS and dual positive and negative ion detection.

ToF-qSIMS Workstation

Advanced time-of-flight SIMS system for surface analysis and depth profiling, delivering sub-ppm trace detection across a wide range of materials.

MAXIM

High-performance quadrupole mass spectrometry system with triple mass filtering, supporting detailed surface composition mapping up to 1000 AMU.

Modular SIMS

Modular SIMS solutions that integrate easily into existing surface analysis chambers for enhanced analytical capability.

XPS for SIMS

Multi-technique UHV surface science system enabling XPS, UPS, AES, SAM, ISS, and LEIS integration with the Hiden SIMS Workstation.